TY  - JOUR
T1  - Effect Annealing and Irradiation on Structural-Optical Properties of
Tin Oxide Thin Films
AU - S. Rasheed, Zahraa AU - H. Alrakabi, Muhanad AU - R. Salim, Sanaa 
JO  - Journal of Engineering and Applied Sciences
VL  - 13
IS  - 23
SP  - 9838
EP  - 9843
PY  - 2018
DA  - 2001/08/19
SN  - 1816-949x
DO  - jeasci.2018.9838.9843
UR  - https://makhillpublications.co/view-article.php?doi=jeasci.2018.9838.9843
KW  - FTIR spectrum
KW  -SnO2 thin films
KW  -annealing temperatures
KW  -irradiation
KW  -optical properties
KW  -energy
AB  - Tin Oxide (SnO<sub>2</sub>) thin films were used in many applied such as in solar cells, optoelectronic devices, heat mirror, gas sensors, etc. The thermal evaporation technique was used for the synthesis of the tin oxide (SnO<sub>2</sub>) thin films. The structural properties were analyzed by Fourier Transforms Infrared spectroscopy (FTIR). These results shown vary of bonds, shapesandpositions of the peaks. When annealing temperatures and affected by irradiation were increased. Optical properties of SnO<sub>2</sub> thin films were investigated using the UV-VIS (T70/80) spectrophotometer. The highest transmittance spectra with annealing and irradiation while the lowest transmittance spectra at annealing temperature 623 K. The value of refractive index n was decreased after annealing temperatures and irradiation. The extinction of coefficient k was found to be very small. The energy gap was decreased with annealing temperature but the energy gap for the sample annealed at 623 K was increased after irradiation.
ER  -