Jamil Al  Azzeh, Daniel Monday  Afodigbokwu, Denis Olegovich  Bobyntsev, Igor Valerievich  Zotov, 
    Implementing Built-In Test in Analog and Mixed-Signal Embedded-Core-Based System-On-Chips,
    Asian Journal of Information Technology,
    Volume 15,Issue 16,
    2016,
    Pages 3082-3086,
    ISSN 1682-3915,
    ajit.2016.3082.3086,
    (https://makhillpublications.co/view-article.php?doi=ajit.2016.3082.3086)
    Abstract: This study aims to develop an approach to test analog and mixed-signal embedded-core-based sSystem-On-Chips (SOCs) with built-in hardware. In particular, Oscillation-Based built-In Self-Test (OBIST) methodology for testing analog components in mixed-signal circuits is implemented in this study. The proposed OBIST structure is utilized for on-chip generation of oscillatory responses corresponding to the analog-circuit components. A major advantage of the OBIST method is that it does not require stimulus generators or complex response analyzers which makes it suitable for testing analog circuits in mixed-signal SOC environments. Extensive simulation results on sample analog and mixed-signal benchmark circuits and other circuits described by netlist in HSPICE format are provided to demonstrate the feasibility, usefulness and relevance of the proposed implementations.
    Keywords: Embedded-core-based system-on-chips;testing;self-test;oscillation-based methodology;analog systems;mixed-signal systems;fault model;test procedure