Ai Manallah  , M. Bouafia  , D.J. Bouzid  , 
    Surface Analysis of Optical Flint Substrate by Multiple Angle Ellipsometric Method,
    Journal of Engineering and Applied Sciences,
    Volume 2,Issue 10,
    2007,
    Pages 1519-1523,
    ISSN 1816-949x,
    jeasci.2007.1519.1523,
    (https://makhillpublications.co/view-article.php?doi=jeasci.2007.1519.1523)
    Abstract: The present research consists in characterizing the surface quality of polished optical glass (LF7) by ellipsometry and use of effective medium model. A correlation between effective roughness layer and ellipsometric measurements has been established as glass fraction f %. Ellipsometric parameters in dependence of polishing time have been measured and treated on the base of the theory of Maxwell-Garnett assuming an effective medium layer of effective thickness d<SUB>e</SUB> and refractive index n<SUB>e</SUB>.
    Keywords: Ellipsometry;effective medium;surface roughness;optical testing;polishing