TY - JOUR
T1 - Investigation of C-V and Gas Sensor Characteristics of Cd1-xZnx S/n-Si Heterojunction Fabricated by Spray Pyrolysis Technique
AU - A. Ghazi, Rusul AU - B. Hasan, Nahida
JO - Journal of Engineering and Applied Sciences
VL - 13
IS - 14
SP - 5926
EP - 5931
PY - 2018
DA - 2001/08/19
SN - 1816-949x
DO - jeasci.2018.5926.5931
UR - https://makhillpublications.co/view-article.php?doi=jeasci.2018.5926.5931
KW - C-V measurements
KW -zinc sulfide
KW -cadmium sulfide
KW -Spray pyrolysis
KW -sensitivity
KW -operating temperature
AB - In this research, Cd1-xZnx S thin films were prepared by spray pyrolysis technique on silicon substrate
at a temperature 360oC. The reverse bias capacitance for Cd1-xZnx S/n-Si heterojunciton was measured as a
function of bias voltage at frequency 1MHz . The capacitance decreases with increasing of reverse bias voltage
and increase with vol. of (x), it increases from 334-577 pF with increase of the (x) while the depletion width
decreasing with increasing (x). We noted that these heterojunction are abrupt and the value of built-in potential
decreases from 0.7-0.27 V with increasing of the ZnS vol.%. The sensitivity as a function of operating
temperature in the range 100-300°C for Cd1-xZnx Sthin films were prepared by spray pyrolysis technique on glass
substrate at 360°C. It is obvious that the sensitivity of all films increases with increasing of the operating
temperature.
ER -