Asian Journal of Information Technology
ISSN: Online 1993-5994ISSN: Print 1682-3915
Abstract
This study depicts novel programmable low power test data compression architecture that permits formation of entropy encoded test scan envelope with exact and adaptable design in context of achieving continuous adjustment with the overlapped test vectors. The proposed architecture proficiently consolidates test compression with logic gates where both software and hardware strategies can work synergistically to convey top-notch test vector compression. Experimental results got from the simulation of proposed architecture add attainability of the proposed scheme and are accounted for test vector compression using hybrid i.e., both hardware and software based test data compression.
How to cite this article:
S. Rooban and R. Manimegalai. Hybrid Architecture for Overlapped Test Vector Compression.
DOI: https://doi.org/10.36478/ajit.2016.4392.4399
URL: https://www.makhillpublications.co/view-article/1682-3915/ajit.2016.4392.4399