Research Journal of Applied Sciences
ISSN: Online 1993-6079ISSN: Print 1815-932x
Abstract
In the research shows the importance of protecting electronic devices from the effects of vibration in terms of their stability and durability. The task of volume 6-stage vibration insulation taking into account rotary fluctuations of a design of electronic devices round axes of the Cartesian system of coordinates is set. Systems of the equations on which the topological model of mechanical processes in system of depreciation of the block of the electronic device is constructed are received. Possibility of connection of macromodels with various number of levels of cascade system of vibration insulation and different quantity of internal elements on each of them is shown. Total accelerations on printing knots and on separate electronic components allow to estimate mechanical stability and durability of electronic devices.
How to cite this article:
Yury Nikolaevich Kofanov and Svetlana Yurevna Sotnikova. Macromodel of Mechanical Processes in the Amortized Electronic Devices.
DOI: https://doi.org/10.36478/rjasci.2015.33.39
URL: https://www.makhillpublications.co/view-article/1815-932x/rjasci.2015.33.39