The Social Sciences
ISSN: Online 1993-6125ISSN: Print 1818-5800
Abstract
The process of quality control in production line is vital for manufacturers in order to sustain mass production product with low cost and high quality. Therefore, the purpose of this study is to develop a statistical control chart for defect detection of microprocessor production line. This study is to observe the pattern of process variability based on 40 lots of product’s samples from the production lines. There are three defect identification methods used in this study, i.e., special top plates, Tim and Adhesive line and control charts. The data is analyzed by using minitab16 statistical software. The finding shows that the control chart is able to identify the control limits of sample defects. Hence, manufacturers are able to make decision either to correct or reject the defective products. It also allowed the manufacturers to revise the center line and control limits for changes in production. However, further study is needed, especially on the use of the control chart for the purpose of problems identification, correction and permanently preventing it from recurring.
How to cite this article:
Erni Tanius and Noorul Ameera Adnan. Detecting Production Line Defect Using Control Chart.
DOI: https://doi.org/10.36478/sscience.2016.7533.7537
URL: https://www.makhillpublications.co/view-article/1818-5800/sscience.2016.7533.7537