Journal of Engineering and Applied Sciences
ISSN: Online 1818-7803ISSN: Print 1816-949x
Abstract
The present state and next state of sequential circuits are not independently controllable and observable. As such, the testing of sequential circuit is complicated. This study presents an approach to design and develop a VLSI system for the simultaneous logic and IDDQ testing of CMOS ICs with mixed-mode testing facility for sequential circuits. The research involves the design of an interfacing unit on PCB containing interfacing circuits for parallel data exchange between a test processor and a microcomputer. This allows IDDQ measurement for every vector used for logic testing, performing logic testing simultaneously, providing a promising IDDQ fault coverage and reducing substantially the time and cost of testing. Three basic test development strategies are considered. They are functional test development, structural test development and physical defect test development. Mixed-mode testing facility is adopted to enhance the performance and reduce the testing time. The simulation result shows that the presence of the sensor does not degrade the normal operation of the CUT.
How to cite this article:
M.S. Amin, Md. Mamun and Mohd. Marufuzzaman. Current Sensor and Compatible Test Processor for
IDDQ Testing of Integrated Circuits.
DOI: https://doi.org/10.36478/jeasci.2012.152.154
URL: https://www.makhillpublications.co/view-article/1816-949x/jeasci.2012.152.154