Journal of Engineering and Applied Sciences
ISSN: Online 1818-7803ISSN: Print 1816-949x
Abstract
The quality of mixed signal devices such as ADC/DAC and their accurate performance in integrated circuits can be determined by testing static characteristics of differential nonlinearity behaviors. Because this testing is not trivial (it requires large number of samples) and extremely expensive, a new approached based on discrete wavelet transform is presented in this study. This proposed methodology of testing is especially, suitable for mixed signal devices due to the special properties of wavelet rescaling and shifting of a signal that allows for multiresolutions to lower number of samples needed to determine the DUT differential nonlinearity. Discrete wavelet transform has provided significant improvements over conventional testing techniques by decreasing computation complexity and reducing testing duration.
How to cite this article:
Emad A. Awada and Cajetan M. Akujuobi. A Wavelet-Based ADC/DAC Differential Nonlinearity Measurement Analysis.
DOI: https://doi.org/10.36478/jeasci.2018.6668.6679
URL: https://www.makhillpublications.co/view-article/1816-949x/jeasci.2018.6668.6679