Journal of Engineering and Applied Sciences
ISSN: Online 1818-7803ISSN: Print 1816-949x
Abstract
This manuscript describes synthesizeof Zinc Oxide (ZnO) thin film by simple chemical method. The structural, topographical and th optical properties of the synthesized thin film were studied by using X-Ray Diffraction (XRD), Atomic Force Microscopy (AFM), Fourier-Transform Infrared Spectroscopy (FTIR), UV-Vis absorption and Optical microscope (OP) image. The XRD pattern of ZnO thin film deposited on a substrate of glass shows polycrystalline structure, the wurtzite structure with average crystallite size 36.207 nm was appeared. While 3D AFM image show 42.35 nm average grain size with 2.69 and 3.19 nm for each roughness average and root mean square, respectively. PL spectra of ZnO thin film revealse that the emission wavelength of ZnO thin film equal to 400 nm and emission energy of the film (3.1 eV).
How to cite this article:
Huda M. Jawad, Ahmed N. Abd and Wasna’a M. Abdulridha. Characterization of a Zinc Oxidethin Film Used Simple Chemical Method.
DOI: https://doi.org/10.36478/jeasci.2018.7537.7540
URL: https://www.makhillpublications.co/view-article/1816-949x/jeasci.2018.7537.7540