Journal of Engineering and Applied Sciences
ISSN: Online 1818-7803ISSN: Print 1816-949x
Abstract
In this study the level of sidewall roughness was monitored with depth and structure of roughness to see its effect to signal quality of optical network. Sidewall roughness is contributes to scattering loss in waveguide and leads to signal distortion. Y-shaped waveguide to develop 1×2 optical splitter was designed with 6 different roughness depth and roughness was placed at 3 different structures. 1×2 optical splitter waveguide integrated into optical network and the signal quality analyzed by its Q-factor. Simulation results show that Q-factor values was decreasing as roughness get deeper on 0.6 μm and sidewall roughness on s-bend structure also, contributes to higher signal distortion compares to roughness on linear structure. Therefore, it is necessary for us to monitor the level of sidewall roughness to ensure the quality of optical signal.
How to cite this article:
I. Shyan Hwang, Mohammad Syuhaimi Ab-Rahman, Ainon Najahah Abd Aziz and Foze Ater Saleh. Sidewall Roughness in Y-Shaped Waveguide: The Effect to the Signal Quality.
DOI: https://doi.org/10.36478/jeasci.2019.7841.7845
URL: https://www.makhillpublications.co/view-article/1816-949x/jeasci.2019.7841.7845