Journal of Engineering and Applied Sciences
ISSN: Online 1818-7803ISSN: Print 1816-949x
Abstract
The present research consists in characterizing the surface quality of polished optical glass (LF7) by ellipsometry and use of effective medium model. A correlation between effective roughness layer and ellipsometric measurements has been established as glass fraction f %. Ellipsometric parameters in dependence of polishing time have been measured and treated on the base of the theory of Maxwell-Garnett assuming an effective medium layer of effective thickness de and refractive index ne.
How to cite this article:
Ai Manallah , M. Bouafia and D.J. Bouzid . Surface Analysis of Optical Flint Substrate by Multiple Angle Ellipsometric Method.
DOI: https://doi.org/10.36478/jeasci.2007.1519.1523
URL: https://www.makhillpublications.co/view-article/1816-949x/jeasci.2007.1519.1523