Journal of Engineering and Applied Sciences
ISSN: Online 1818-7803ISSN: Print 1816-949x
Abstract
Tin Oxide (SnO2) thin films were used in many applied such as in solar cells, optoelectronic devices, heat mirror, gas sensors, etc. The thermal evaporation technique was used for the synthesis of the tin oxide (SnO2) thin films. The structural properties were analyzed by Fourier Transforms Infrared spectroscopy (FTIR). These results shown vary of bonds, shapesandpositions of the peaks. When annealing temperatures and affected by irradiation were increased. Optical properties of SnO2 thin films were investigated using the UV-VIS (T70/80) spectrophotometer. The highest transmittance spectra with annealing and irradiation while the lowest transmittance spectra at annealing temperature 623 K. The value of refractive index n was decreased after annealing temperatures and irradiation. The extinction of coefficient k was found to be very small. The energy gap was decreased with annealing temperature but the energy gap for the sample annealed at 623 K was increased after irradiation.
How to cite this article:
Zahraa S. Rasheed, Muhanad H. Alrakabi and Sanaa R. Salim. Effect Annealing and Irradiation on Structural-Optical Properties of
Tin Oxide Thin Films.
DOI: https://doi.org/10.36478/jeasci.2018.9838.9843
URL: https://www.makhillpublications.co/view-article/1816-949x/jeasci.2018.9838.9843